Crystal grain evaluation device - メーカー・企業と製品の一覧

[Analysis Case] Evaluation of Crystal Grains and Resistance in CIGS Thin-Film Solar Cells

Resistance distribution and evaluation of crystal grains and grain boundaries at the same location.

In SSRM, we can obtain insights into local resistance, while in EBSD, we can gain knowledge about crystal grains and grain boundaries. By conducting SSRM measurements at the same location as the EBSD measurements, we measured the local resistance in areas that include crystal grain boundaries, which we would like to introduce.